FIB-SEM [FBbi_00050000]
A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step.
FIB-SEM
ID: FBbi_00050000
Class
A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step.
Open in VFB 3D Browser →Alternative Names
| Synonym | Scope | Reference |
|---|---|---|
| FIB-SEM | exact synonym |
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